基本信息
This micro-X-ray fluorescence spectrometer is designed for micro-sample and high-precision element distribution analysis scenarios, targeting cultural relics protection institutions, archaeological research institutes, semiconductor manufacturing and micro-material analysis fields. It can achieve non-destructive detection of micro-scale samples, accurately analyzing the element components and distribution of tiny cultural relics, micro-electronic devices and other micro-samples, providing important technical support for cultural relics restoration and micro-material research.