基本信息
This combined optical and contact CMM integrates optical image measurement and contact probe measurement, which is suitable for the comprehensive detection of small and ultra-small precision parts. It solves the problem that single measurement mode cannot meet the detection needs of complex small parts, and can realize non-contact measurement of smooth surfaces and contact measurement of inner hole and side features. It is widely used in jewelry processing, clock manufacturing, micro-electronic parts and other industries that require high-precision detection of small parts.
发布询价
聊天
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