基本信息
This scientific research grade roughness profiler is oriented to high-end scientific research and high-precision testing needs, focusing on ultra-high precision and customizable functions. It adapts to high-precision surface contour and roughness detection in materials science, semiconductor R&D and precision optics fields, solving the pain point that ordinary equipment cannot meet the needs of scientific research grade testing accuracy and customization. It is equipped with a high-performance industrial main control platform, supports multiple customized testing functions, and can output more than 50 kinds of surface parameters, meeting the testing needs of high-end scientific research and R&D.
发布询价
聊天
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