基本信息
This non-contact laser profilometer focuses on high-speed and non-destructive surface inspection, designed for high-precision measurement requirements of easily deformed and soft workpieces. It can obtain high-precision profile data without contacting the tested workpiece, suitable for scenarios such as semiconductor wafers, flexible circuit boards and precision ceramics that cannot be contacted for inspection. Equipped with high-speed laser scanning technology, it can achieve millisecond batch inspection, greatly improving quality inspection efficiency.
发布询价
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